SOPRA is a thin film metrology company

It manufactures high precision scientific R&D instruments and industrial tools for thin film measurements with optical solutions.

Well known for its award winning metrology offer for flat panel display production line and after having helped this industry, directed towards a mass market, become mature SOPRA has decided to accentuate its efforts on the upstream parts of the most innovating processes in these technologies.

SOPRA’s next challenge is to be the reference in the development of new materials and processes by bringing the most powerful optical metrology to the industrial groups and academic research centres.


NEW NOMINATION IN SALES DEPARTMENT Ellipsometry Porosimetry : Nature of materials and applications evolve continuously and SOPRA, based on Exclusive licence from IMEC, successfully introduced the Ellipsometer Porosimeter product line dedicated to full characterization of porous thin films. This technic allows not only to give porous thin films porosity, but also to measure pore size and pore size distribution of such single or multilayer thin films in less than 20mn. Compared to traditionnal porosimeters, Ellipsometric porosimeters does not require sample preparation. Based on our robust Spectroscopic Ellipsometers allowing optical index and film thickness measurement, these tools have been adopted by advanced R&D center in Si manufacturing and renowed laboratories working on Sol Gel, polymer and porous functionnalised surfaces.		Sales and support Locations RFQ RFI


	SOPRA products are based on more than 30 years of optical expertise in spectrometer and spectrographs.
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	SE based technics have been now adopted in various fields as contactless metrology.
Description of technics Applications by topics Applications by materials

18 - 23 May 2008
213th ECS Meeting
Phoenix - Arizona/USA
SOPRA will welcome you on booth #203 and will be pleased you attend the following oral presentations:
"Ellipsometric Porosimetry : Fast and Non Destructive Characterization for a Range of Porous Thin Films; Highlights on Energy and Microelectronic Applications." Author(s): C. Walsh, A. Bondaz, Y. Turcant and A. Bourgeois
Date & Time: Monday, May 19, 2008 at 15:00h - Room 105C, 100 Level, Phoenix Convention Center Symposium Title: B4 - Characterization of Porous Materials
"Characterization Of Organic Solar Cells Materials and Structures by Spectroscopic Ellipsometry and Porosimetry Technique" Author(s): A. Bondaz, L. Kitzinger and C. Defranoux
Date and Time: Wednesday, May 21, 2008 at 16:20h - Room 211B, 200 Level, Phoenix Convention Center Symposium Title: B5 - Fundamentals of Energy Storage and Conversion

20 - 22 May 2008
TPE 08 - Technologies for Polymer Electronics
Rudolstadt/Germany
SOPRA, Ms Christine WALSH will present 3 posters during TPE and will be pleased to give you all information you may request on our Spectroscopic Ellipsometers.
1. ELLIPSOMETRY POROSIMETRY: FAST AND NON DESTRUCTIVE METHOD OF POROSITY CHARACTERIZATION OF MESOPOROUS THIN FILMS EXAMPLE OF CUBIC TiO2 USED IN DYE SENSITIZED SOLAR CELL
2. CHARACTERIZATION OF OLED BY SPECTROSCOPIC ELLIPSOMETRY
3. CHARACTERIZATION OF MATERIALS AND MULTILAYERS STRUCTURES OF ORGANIC SOLAR CELLS BY SPECTROSCOPIC ELLIPSOMETRY

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