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Spectroscopic Ellipsometer (SE)
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EP R&D

The SOPRALAB EP R&D is adapted from our EP series, to provide a modular solution that is tailored to respond to tomorrows advanced requirements for the development of sophisticated materials. The adsorption chamber is integratable on the R&D Spectroscopic Ellipsometer (SE) for Thin Film evaluation. Its design is aimed at facilitating the investigation of small test samples, whereby the adsorptive selected is best suited to the particular pore morphology. Furthermore, the unit permits the incorporation of a cryostat for superior temperature control. In addition, the in situ investigation can be coupled with the Infra Red Spectroscopic Ellipsometer in order to determine the chemical behavior within the porous network. Therefore, the EP R&D provides a modular platform for the comprehensive study of a broad range of materials.

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