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Spectroscopic Ellipsometer (SE)
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Combined metrology
Porosimeter Ellipsometer
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Excimer Laser SAELC
EUVR

The system is working in the 12 to 14 nm range with a spectral precision of +/- 0.1nm with a resolution l/Dl of 100 @13.4nm. The angular range is comprised between 5° to 90°. 
The system operates with a basic vacuum of the analysis chamber in the 10-5-10-6 mbar range. This allows minimisation of the contamination.

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