As President I am very proud of the accomplished work and very enthusiast about the potential outcome of the current projects.
In 1983, SOPRA introduced the first Spectroscopic Ellipsometer instrument in the world. From that date Spectroscopic Ellipsometry (SE) became the reference optical non destructive metrology for characterization of thin film.

SOPRA's ability to design and manufacture high quality metrology tools and analytical equipment with integrated mechanics, optics, electronics and software is considered as one of our company's key assets.
As a well established leader in both R&D and industry, SOPRA brings state-of-the-art technology in the Academic Scientific Research Laboratories and in the R&D Laboratories of several industries.

SOPRA has a recognised policy of continuous improvement and innovation to fulfil the most advanced requirement of its customers.
Listening carefully to customer requirements and responding with world class quality and innovation have been key factor in the SOPRA's steady growth.
Hundreds of our Spectroscopic Ellipsometer are used every day on the five continents: we export 95 % worldwide .
Behind this success: an ongoing commitment to total quality management that is present at every level of our organization. This has been an essential element in driving our continued expansion in the international market.

With the time we extended the spectral range of our Spectroscopic Ellipsometer tools from Deep UV (below 157 nm) up to Infra-Red ( over 30 microns ) making Spectroscopic Ellipsometry a well established technic.
We also add several measurements technologies on our metrology platform :such as GXR (Grazing X Rays) for atomic layers of very thin film, FTIR for Infra Red Ellipsometry. These combined Metrology set ups are unique on the market.

Today, we are delivering not only SE tools for thin film but also Ellipsometric Porosimeters (EP) for porous thin film characterisation (IMEC‘s license).

Our customers use our reference tools for optics , new materials , semiconductors , flat panel displays , solar cells , organic materials and for many other fields of applications where thin film and new materials count.

For these reasons and more, SOPRA is just the metrology partner for the thin film metrology application based on optical solutions.

Marc Stehle CEO

France
At the French headquarter and R&D facilities, located in a 2000 m² building, the company designs, develops and manufactures a wide range of products based on Spectroscopic Ellipsometry.
With the help of its American subsidiary and its network of highly qualified distributors, SOPRA serves a worldwide market in the Optical Metrology.

USA
Established in 1990, SOPRA's American subsidiary located in San Francisco, is responsible for sales, high-level technical support and service.

Japan
SEIKA Corp. is SOPRA's products distributor responsible for commercial and technical support in Japan since 1989. The two companies have cemented their long-term relationship when SEIKA became one of SOPRA's shareholders in 1995.

Other countries
SOPRA selected qualified distributors to serve its markets in other countries, contacts us.