As President I am very proud of the accomplished work and very enthusiast about the potential outcome of the current projects.
In 1983, SOPRALAB introduced the first Spectroscopic Ellipsometer instrument in the world. From that date Spectroscopic Ellipsometry (SE) became the reference optical non destructive metrology for characterization of thin film.

SOPRALAB's ability to design and manufacture high quality metrology tools and analytical equipment with integrated mechanics, optics, electronics and software is considered as one of our company's key assets.
As a well established leader in both R&D and industry, SOPRALAB brings state-of-the-art technology in the Academic Scientific Research Laboratories and in the R&D Laboratories of several industries.

SOPRALAB has a recognised policy of continuous improvement and innovation to fulfil the most advanced requirement of its customers.
Listening carefully to customer requirements and responding with world class quality and innovation have been key factor in the SOPRALAB's steady growth.
Hundreds of our Spectroscopic Ellipsometer are used every day on the five continents: we export 95% worldwide .
Behind this success: an ongoing commitment to total quality management that is present at every level of our organization. This has been an essential element in driving our continued expansion in the international market.

With the time we extended the spectral range of our Spectroscopic Ellipsometer tools from Deep UV (below 157 nm) up to Infra-Red (over 30 microns) making Spectroscopic Ellipsometry a well established technique.
We also add several measurements technologies on our metrology platform: such as GXR (Grazing X Rays) for atomic layers of very thin film, FTIR for Infra Red Ellipsometry. These combined Metrology set ups are unique on the market.

Today, we are delivering not only SE tools for thin film but also Ellipsometric Porosimeters (EP) for porous thin film characterisation (IMEC‘s license). SOPRALAB also develops SE for Thin Film Photovoltaic.

Our customers use our reference tools for optics, new materials, semiconductors , flat panel displays , solar cells , organic materials and for many other fields of applications where thin film and new materials count.

For these reasons and more, SOPRALAB is just the metrology partner for the thin film metrology application based on optical solutions.

Marc Stehle COO